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Registration Deadline: 16 January 2017

matchar2017

Programme

09:00 REGISTRATION
09:30 WORKSHOP PRESENTATION AND BRIEF INTRODUCTION
Xavier Obradors (Director of ICMAB)
Jordi Rius (Organizer of the workshop)

9:45 Enrico Mugnanioli (University of Siena)

“Application of electron diffraction tomography to nanomaterials characterisation”
10:45 Jose Santiso  (CIN2)
“ High resolution X-ray diffraction “

11:15 COFFEE BREAK


11:45 Jose Santiso  (CIN2)
Application of X-ray diffraction for time-resolved experiments on thin films  under non-ambient conditions
12:30 Anna Crespi  (ICMAB-CSIC)
“Applications of 2D detectors to materials characterisation (textures)”
13:00 Carlos Frontera  (ICMAB-CSIC)
“3D reciprocal space maps in thin films”

13:30 LUNCH BREAK

15:00 Xavier Alcobé  (CCiTUB, University of Barcelona)
“Application of XRD to the quantitative analysis of materials”
15:45 Oriol Vallcorba (ALBA-CELLS)
"Synchrotron tts-microdiffraction and related transmission diffraction methodologies for materials characterisation"

16:30 END OF WORKSHOP


MATCHAR2017

Organizers

Commission of Seminars and Traning of ICMAB-CSIC

matchar2017

Registration

ICMAB workshop
REGISTRATION FREE

DEADLINE: 16 JANUARY 2017

matchar2017

Venue

INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA

Campus de la UAB, 08193 Bellaterra, Barcelona, Spain

stay in touch

Contact us

Phone: +34 935 801 853

Fax: +34 935 805 729

Campus de la UAB

08193 Bellaterra

Barcelona, Spain